GEORDIE JOHNSON. Anomaly Detection in Semiconductor Process Validation Using Unsupervised Learning and Generative Models. INTERNATIONAL JOURNAL OF ENGINEERING AND TECHNOLOGY RESEARCH & DEVELOPMENT, [S. l.], v. 3, n. 2, p. 5–10, 2022. Disponível em: https://ijetrd.com/index.php/ijetrd/article/view/IJETRD.03.02.002.. Acesso em: 30 apr. 2025.